Ion contamination tester

Ion contamination tester用途：

适用于电子元器件，电路板，电路板组，测试原理符合MIL,IPC/ANSI-J-STD,F,IE-STD各种测试标准

Purpose:

Suitable for electronic components, circuit boards, circuit board groups, testing principle in line with Mil, IPC/ANSI-J-STD, F, IE-STD test standards